| Literature DB >> 25677688 |
S McVitie1, D McGrouther2, S McFadzean2, D A MacLaren2, K J O'Shea2, M J Benitez2.
Abstract
We present results from an aberration corrected scanning transmission electron microscope which has been customised for high resolution quantitative Lorentz microscopy with the sample located in a magnetic field free or low field environment. We discuss the innovations in microscope instrumentation and additional hardware that underpin the imaging improvements in resolution and detection with a focus on developments in differential phase contrast microscopy. Examples from materials possessing nanometre scale variations in magnetisation illustrate the potential for aberration corrected Lorentz imaging as a tool to further our understanding of magnetism on this lengthscale.Keywords: Aberration correction; Differential phase contrast; Lorentz microscopy; Magnetic thin films
Year: 2015 PMID: 25677688 DOI: 10.1016/j.ultramic.2015.01.003
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689