Literature DB >> 25590438

Anomalous rapid defect annihilation in self-assembled nanopatterns by defect melting.

Bong Hoon Kim1, So Jung Park, Hyeong Min Jin, Ju Young Kim, Seung-Woo Son, Myung-Hyun Kim, Chong Min Koo, Jonghwa Shin, Jaeup U Kim, Sang Ouk Kim.   

Abstract

Molecular self-assembly commonly suffers from dense structural defect formation. Spontaneous defect annihilation in block copolymer (BCP) self-assembly is particularly retarded due to significant energy barrier for polymer chain diffusion and structural reorganization. Here we present localized defect melting induced by blending short neutral random copolymer chain as an unusual method to promote the defect annihilation in BCP self-assembled nanopatterns. Chemically neutral short random copolymer chains blended with BCPs are specifically localized and induce local disordered states at structural defect sites in the self-assembled nanopatterns. Such localized "defect melting" relieves the energy penalty for polymer diffusion and morphology reorganization such that spontaneous defect annihilation by mutual coupling is anomalously accelerated upon thermal annealing. Interestingly, neutral random copolymer chain blending also causes morphology-healing self-assembly behavior that can generate large-area highly ordered 10 nm scale nanopattern even upon poorly defined defective prepatterns. Underlying mechanisms of the unusual experimental findings are thoroughly investigated by three-dimensional self-consistent field theory calculation.

Entities:  

Keywords:  Self-assembly; block copolymer; defect; nanopattern

Year:  2015        PMID: 25590438     DOI: 10.1021/nl5042935

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  2 in total

1.  Perpendicularly oriented sub-10-nm block copolymer lamellae by atmospheric thermal annealing for one minute.

Authors:  Takehiro Seshimo; Rina Maeda; Rin Odashima; Yutaka Takenaka; Daisuke Kawana; Katsumi Ohmori; Teruaki Hayakawa
Journal:  Sci Rep       Date:  2016-01-19       Impact factor: 4.379

2.  High-throughput morphology mapping of self-assembling ternary polymer blends.

Authors:  Kristof Toth; Chinedum O Osuji; Kevin G Yager; Gregory S Doerk
Journal:  RSC Adv       Date:  2020-11-24       Impact factor: 4.036

  2 in total

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