Literature DB >> 25537384

Nuclear-weighted X-ray maximum entropy method - NXMEM.

Sebastian Christensen1, Niels Bindzus1, Mogens Christensen1, Bo Brummerstedt Iversen1.   

Abstract

Subtle structural features such as disorder and anharmonic motion may be accurately characterized from nuclear density distributions (NDDs). As a viable alternative to neutron diffraction, this paper introduces a new approach named the nuclear-weighted X-ray maximum entropy method (NXMEM) for reconstructing pseudo NDDs. It calculates an electron-weighted nuclear density distribution (eNDD), exploiting that X-ray diffraction delivers data of superior quality, requires smaller sample volumes and has higher availability. NXMEM is tested on two widely different systems: PbTe and Ba(8)Ga(16)Sn(30). The first compound, PbTe, possesses a deceptively simple crystal structure on the macroscopic level that is unable to account for its excellent thermoelectric properties. The key mechanism involves local distortions, and the capability of NXMEM to probe this intriguing feature is established with simulated powder diffraction data. In the second compound, Ba(8)Ga(16)Sn(30), disorder among the Ba guest atoms is analysed with both experimental and simulated single-crystal diffraction data. In all cases, NXMEM outperforms the maximum entropy method by substantially enhancing the nuclear resolution. The induced improvements correlate with the amount of available data, rendering NXMEM especially powerful for powder and low-resolution single-crystal diffraction. The NXMEM procedure can be implemented in existing software and facilitates widespread characterization of disorder in functional materials.

Entities:  

Keywords:  Ba8Ga16Sn30; PbTe; X-ray diffraction; clathrates; disordered structures; maximum entropy method; nuclear density distribution; thermoelectricity

Year:  2015        PMID: 25537384     DOI: 10.1107/S2053273314024103

Source DB:  PubMed          Journal:  Acta Crystallogr A Found Adv        ISSN: 2053-2733            Impact factor:   2.290


  1 in total

1.  Carrier concentration dependence of structural disorder in thermoelectric Sn1-x Te.

Authors:  Mattia Sist; Ellen Marie Jensen Hedegaard; Sebastian Christensen; Niels Bindzus; Karl Frederik Færch Fischer; Hidetaka Kasai; Kunihisa Sugimoto; Bo Brummerstedt Iversen
Journal:  IUCrJ       Date:  2016-08-22       Impact factor: 4.769

  1 in total

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