Literature DB >> 25513936

A new approach for high-yield metal-molecule-metal junctions by direct metal transfer method.

Hyunhak Jeong1, Dongku Kim, Pilkwang Kim, Myung Rae Cho, Wang-Taek Hwang, Yeonsik Jang, Kyungjune Cho, Misook Min, Dong Xiang, Yun Daniel Park, Heejun Jeong, Takhee Lee.   

Abstract

The realization of high-yield, stable molecular junctions has been a long-standing challenge in the field of molecular electronics research, and it is an essential prerequisite for characterizing and understanding the charge transport properties of molecular junctions prior to their device applications. Here, we introduce a new approach for obtaining high-yield, vertically structured metal-molecule-metal junctions in which the top metal electrodes are formed on alkanethiolate self-assembled monolayers by a direct metal transfer method without the use of any additional protecting interlayers in the junctions. The fabricated alkanethiolate molecular devices exhibited considerably improved device yields (∼70%) in comparison to the typical low device yields (less than a few %) of molecular junctions in which the top metal electrodes are fabricated using the conventional evaporation method. We compared our method with other molecular device fabrication methods in terms of charge transport parameters. This study suggests a potential new device platform for realizing robust, high-yield molecular junctions and investigating the electronic properties of devices.

Entities:  

Year:  2014        PMID: 25513936     DOI: 10.1088/0957-4484/26/2/025601

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  1 in total

1.  Protective Layers Based on Carbon Paint To Yield High-Quality Large-Area Molecular Junctions with Low Contact Resistance.

Authors:  Senthil Kumar Karuppannan; Esther Hui Lin Neoh; Ayelet Vilan; Christian A Nijhuis
Journal:  J Am Chem Soc       Date:  2020-02-07       Impact factor: 15.419

  1 in total

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