Literature DB >> 25495846

Effect of interface atomic structure on the electronic properties of nano-sized metal-oxide interfaces.

Wei Qin1, Jiechang Hou, Dawn A Bonnell.   

Abstract

We report that the size dependence of electronic properties at nanosized metal-semiconducting oxide interfaces is significantly affected by the interface atomic structure. The properties of interfaces with two orientations are compared over size range of 20-200 nm. The difference in interface atomic structure leads to electronic structure differences that alter electron transfer paths. Specifically, interfaces with a higher concentration of undercoordinated Ti result in enhanced tunneling due to the presence of defect states or locally reduced tunnel barrier widths. This effect is superimposed on the mechanisms of size dependent properties at such small scales.

Entities:  

Keywords:  AFM; TEM; electronic properties; interface structure; metal oxide; metal−semiconductor interface

Year:  2014        PMID: 25495846     DOI: 10.1021/nl503389b

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  1 in total

1.  Measuring and directing charge transfer in heterogenous catalysts.

Authors:  Michael J Zachman; Victor Fung; Felipe Polo-Garzon; Shaohong Cao; Jisue Moon; Zhennan Huang; De-En Jiang; Zili Wu; Miaofang Chi
Journal:  Nat Commun       Date:  2022-06-06       Impact factor: 17.694

  1 in total

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