| Literature DB >> 25495846 |
Wei Qin1, Jiechang Hou, Dawn A Bonnell.
Abstract
We report that the size dependence of electronic properties at nanosized metal-semiconducting oxide interfaces is significantly affected by the interface atomic structure. The properties of interfaces with two orientations are compared over size range of 20-200 nm. The difference in interface atomic structure leads to electronic structure differences that alter electron transfer paths. Specifically, interfaces with a higher concentration of undercoordinated Ti result in enhanced tunneling due to the presence of defect states or locally reduced tunnel barrier widths. This effect is superimposed on the mechanisms of size dependent properties at such small scales.Entities:
Keywords: AFM; TEM; electronic properties; interface structure; metal oxide; metal−semiconductor interface
Year: 2014 PMID: 25495846 DOI: 10.1021/nl503389b
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189