Extracting depth information of 3-dimensional structures from a single-view X-ray Fourier-transform hologram.

We demonstrate how information about the three-dimensional structure of an object can be extracted from a single Fourier-transform X-ray hologram. In contrast to lens-based 3D imaging approaches that provide depth information of a specimen utilizing several images from different angles or via adjusting the focus to different depths, our method capitalizes on the use of the holographically encoded phase and amplitude information of the object's wavefield. It enables single-shot measurements of 3D objects at coherent X-ray sources. As the ratio of longitudinal resolution over transverse resolution scales proportional to the diameter of the reference beam aperture over the X-ray wavelength, we expect the approach to be particularly useful in the extreme ultraviolet and soft-X-ray regime.