Literature DB >> 25377595

Settling the "dead layer" debate in nanoscale capacitors.

Li-Wu Chang1, Marin Alexe2, James F Scott3, J Marty Gregg1.   

Abstract

Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO3 /Pt, but are relatively unaffected in Pt/BaTiO3 /Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers".
Copyright © 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Year:  2009        PMID: 25377595     DOI: 10.1002/adma.200901756

Source DB:  PubMed          Journal:  Adv Mater        ISSN: 0935-9648            Impact factor:   30.849


  2 in total

Review 1.  Ultrathin Ferroelectric Films: Growth, Characterization, Physics and Applications.

Authors:  Ying Wang; Weijin Chen; Biao Wang; Yue Zheng
Journal:  Materials (Basel)       Date:  2014-09-11       Impact factor: 3.623

2.  Low value for the static background dielectric constant in epitaxial PZT thin films.

Authors:  Georgia Andra Boni; Cristina Florentina Chirila; Luminita Hrib; Raluca Negrea; Lucian Dragos Filip; Ioana Pintilie; Lucian Pintilie
Journal:  Sci Rep       Date:  2019-10-11       Impact factor: 4.379

  2 in total

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