| Literature DB >> 25360950 |
Qi Mao, Qi-Ye Wen, Wei Tian, Tian-Long Wen, Zhi Chen, Qing-Hui Yang, Huai-Wu Zhang.
Abstract
We present a broadband terahertz wave modulator with improved modulation depth and switch speed by cautiously selecting the gate dielectric materials in a large-area graphene-based field-effect transistor (GFET). An ultrathin Al2O3 film (∼60 nm) is deposited by an atomic-layer-deposition technique as a high-k gate dielectric layer, which reduces the Coulomb impurity scattering and cavity effect, and thus greatly improves the modulation performance. Our modulator has achieved a modulation depth of 22% and modulation speed of 170 kHz in a frequency range from 0.4 to 1.5 THz, which is a large improvement in comparison to its predecessor of SiO2-based GFET.Entities:
Year: 2014 PMID: 25360950 DOI: 10.1364/OL.39.005649
Source DB: PubMed Journal: Opt Lett ISSN: 0146-9592 Impact factor: 3.776