Literature DB >> 25312246

Stimulated excitation electron microscopy and spectroscopy.

A Howie1.   

Abstract

Recent advances in instrumentation for electron optics and spectroscopy have prompted exploration of ultra-low excitations such as phonons, bond vibrations and Johnson noise. These can be excited not just with fast electrons but also thermally or by other external sources of radiation. The near-field theory of electron energy loss and gain provides a convenient platform for analysing these processes. Possibilities for selected phonon mapping and imaging are discussed. Effects should certainly be observable in atomic resolution structure imaging but diffraction contrast imaging could perhaps be more informative. Additional exciting prospects to be explored include the transition from phonon excitation to single atom recoil and the boosting of energy loss and gain signals with tuned laser illumination.
Copyright © 2014 Elsevier B.V. All rights reserved.

Keywords:  Atomic displacement; Laser-boosted interactions; Near-field excitation; Phonon imaging

Year:  2014        PMID: 25312246     DOI: 10.1016/j.ultramic.2014.09.006

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  2 in total

1.  Infrared PINEM developed by diffraction in 4D UEM.

Authors:  Haihua Liu; John Spencer Baskin; Ahmed H Zewail
Journal:  Proc Natl Acad Sci U S A       Date:  2016-02-04       Impact factor: 11.205

2.  Spectral Interferometry with Electron Microscopes.

Authors:  Nahid Talebi
Journal:  Sci Rep       Date:  2016-09-21       Impact factor: 4.379

  2 in total

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