Literature DB >> 25307160

Vanadium dioxide nanowire-based microthermometer for quantitative evaluation of electron beam heating.

H Guo1, M I Khan2, C Cheng3, W Fan3, C Dames2, J Wu3, A M Minor1.   

Abstract

Temperature measurement is critical for many technological applications and scientific experiments, and different types of thermometers have been developed to detect temperature at macroscopic length scales. However, quantitative measurement of the temperature of nanostructures remains a challenge. Here, we show a new type of microthermometer based on a vanadium dioxide nanowire. Its mechanism is derived from the metal-insulator transition of vanadium dioxide at 68 °C. As our results demonstrate, this microthermometer can serve as a thermal flow meter to investigate sample heating from the incident electron beam using a transmission electron microscope. Owing to its small size the vanadium dioxide nanowire-based microthermometer has a large measurement range and high sensitivity, making it a good candidate to explore the temperature environment of small spaces or to monitor the temperature of tiny, nanoscale objects.

Entities:  

Year:  2014        PMID: 25307160     DOI: 10.1038/ncomms5986

Source DB:  PubMed          Journal:  Nat Commun        ISSN: 2041-1723            Impact factor:   14.919


  4 in total

1.  Direct Quantification of Heat Generation Due to Inelastic Scattering of Electrons Using a Nanocalorimeter.

Authors:  Joonsuk Park; Kiho Bae; Taeho Roy Kim; Christopher Perez; Aditya Sood; Mehdi Asheghi; Kenneth E Goodson; Woosung Park
Journal:  Adv Sci (Weinh)       Date:  2020-12-21       Impact factor: 16.806

2.  Dynamical backaction cooling with free electrons.

Authors:  A Niguès; A Siria; P Verlot
Journal:  Nat Commun       Date:  2015-09-18       Impact factor: 14.919

3.  Electrochemical gating-induced reversible and drastic resistance switching in VO2 nanowires.

Authors:  Tsubasa Sasaki; Hiroki Ueda; Teruo Kanki; Hidekazu Tanaka
Journal:  Sci Rep       Date:  2015-11-20       Impact factor: 4.379

4.  Precise nanoscale temperature mapping in operational microelectronic devices by use of a phase change material.

Authors:  Qilong Cheng; Sukumar Rajauria; Erhard Schreck; Robert Smith; Na Wang; Jim Reiner; Qing Dai; David Bogy
Journal:  Sci Rep       Date:  2020-11-18       Impact factor: 4.379

  4 in total

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