Literature DB >> 25178001

Ptychography with multilayer Laue lenses.

Adam Kubec1, Stefan Braun2, Sven Niese3, Peter Krüger3, Jens Patommel4, Michael Hecker5, Andreas Leson2, Christian G Schroer4.   

Abstract

Two different multilayer Laue lens designs were made with total deposition thicknesses of 48 µm and 53 µm, and focal lengths of 20.0 mm and 12.5 mm at 20.0 keV, respectively. From these two multilayer systems, several lenses were manufactured for one- and two-dimensional focusing. The latter is realised with a directly bonded assembly of two crossed lenses, that reduces the distance between the lenses in the beam direction to 30 µm and eliminates the necessity of producing different multilayer systems. Characterization of lens fabrication was performed using a laboratory X-ray microscope. Focusing properties have been investigated using ptychography.

Keywords:  X-ray nanofocusing; multilayer Laue lens; ptychography; scanning X-ray microscopy

Year:  2014        PMID: 25178001     DOI: 10.1107/S1600577514014556

Source DB:  PubMed          Journal:  J Synchrotron Radiat        ISSN: 0909-0495            Impact factor:   2.616


  1 in total

1.  Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques.

Authors:  Frank Seiboth; Dennis Brückner; Maik Kahnt; Mikhail Lyubomirskiy; Felix Wittwer; Dmitry Dzhigaev; Tobias Ullsperger; Stefan Nolte; Frieder Koch; Christian David; Jan Garrevoet; Gerald Falkenberg; Christian G Schroer
Journal:  J Synchrotron Radiat       Date:  2020-07-30       Impact factor: 2.616

  1 in total

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