| Literature DB >> 25178001 |
Adam Kubec1, Stefan Braun2, Sven Niese3, Peter Krüger3, Jens Patommel4, Michael Hecker5, Andreas Leson2, Christian G Schroer4.
Abstract
Two different multilayer Laue lens designs were made with total deposition thicknesses of 48 µm and 53 µm, and focal lengths of 20.0 mm and 12.5 mm at 20.0 keV, respectively. From these two multilayer systems, several lenses were manufactured for one- and two-dimensional focusing. The latter is realised with a directly bonded assembly of two crossed lenses, that reduces the distance between the lenses in the beam direction to 30 µm and eliminates the necessity of producing different multilayer systems. Characterization of lens fabrication was performed using a laboratory X-ray microscope. Focusing properties have been investigated using ptychography.Keywords: X-ray nanofocusing; multilayer Laue lens; ptychography; scanning X-ray microscopy
Year: 2014 PMID: 25178001 DOI: 10.1107/S1600577514014556
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616