Literature DB >> 25166579

Anomalous impurity segregation and local bonding fluctuation in l-Si.

G Fisicaro1, K Huet2, R Negru2, M Hackenberg3, P Pichler4, N Taleb5, A La Magna1.   

Abstract

Anomalous impurity redistribution after a laser irradiation process in group-IV elements has been reported in numerous papers. In this Letter, we correlate this still unexplained behavior with the peculiar bonding character of the liquid state of group-IV semiconductors. Analyzing the B-Si system in a wide range of experimental conditions we demonstrate that this phenomenon derives from the non-Fickian diffusion transport of B in l-Si. The proposed diffusion model relies on the balance between two impurity states in different bonding configurations: one migrating at higher diffusivity than the other. This microscopic mechanism explains the anomalous B segregation, whereas accurate comparisons between experimental chemical profiles and simulation results validate the model.

Entities:  

Year:  2013        PMID: 25166579     DOI: 10.1103/PhysRevLett.110.117801

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  1 in total

1.  Boron Partitioning Coefficient above Unity in Laser Crystallized Silicon.

Authors:  Patrick C Lill; Morris Dahlinger; Jürgen R Köhler
Journal:  Materials (Basel)       Date:  2017-02-16       Impact factor: 3.623

  1 in total

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