| Literature DB >> 25115804 |
Jingli Wang1, Xuming Zou, Xiangheng Xiao, Lei Xu, Chunlan Wang, Changzhong Jiang, Johnny C Ho, Ti Wang, Jinchai Li, Lei Liao.
Abstract
Charge trapping layers are formed from different metallic nanocrystals in MoS2 -based nanocrystal floating gate memory cells in a process compatible with existing fabrication technologies. The memory cells with Au nanocrystals exhibit impressive performance with a large memory window of 10 V, a high program/erase ratio of approximately 10(5) and a long retention time of 10 years.Entities:
Keywords: MoS2; flash memory; floating gates; metallic nanocrystals; work functions
Year: 2014 PMID: 25115804 DOI: 10.1002/smll.201401872
Source DB: PubMed Journal: Small ISSN: 1613-6810 Impact factor: 13.281