| Literature DB >> 25103570 |
Sebastian Macke1, Abdullah Radi, Jorge E Hamann-Borrero, Adriano Verna, Martin Bluschke, Sebastian Brück, Eberhard Goering, Ronny Sutarto, Feizhou He, Georg Cristiani, Meng Wu, Eva Benckiser, Hanns-Ulrich Habermeier, Gennady Logvenov, Nicolas Gauquelin, Gianluigi A Botton, Adam P Kajdos, Susanne Stemmer, George A Sawatzky, Maurits W Haverkort, Bernhard Keimer, Vladimir Hinkov.
Abstract
The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers.Keywords: complex functional materials; depth profiling; non-destructive characterization; resonant X-ray reflectivity; thin film heterostructures
Mesh:
Year: 2014 PMID: 25103570 DOI: 10.1002/adma.201402028
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849