Literature DB >> 25090197

Model-based phase shifting interferometry.

Leslie L Deck.   

Abstract

A general method of surface profiling with phase-shifting interferometry techniques uses iterative linear regression to fit the sequence of interferograms to a physical model of the cavity. The physical model incorporates all important cavity influences, including environmentally induced rigid-body motion, phase shifter miscalibrations, multiple interference, geometry-induced spatial phase-shift variations, and their cross-couplings. By incorporating an initial estimate of the surface profile and iteratively solving for space- and time-dependent variables separately, convergence is robust and rapid. The technique has no restriction on surface shape or departure.

Year:  2014        PMID: 25090197     DOI: 10.1364/AO.53.004628

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  2 in total

1.  Multi-Field Interference Simultaneously Imaging on Single Image for Dynamic Surface Measurement.

Authors:  Weiqiang Han; Xiaodong Gao; Zhen Chen; Le Bai; Bo Liu; Rujin Zhao
Journal:  Sensors (Basel)       Date:  2020-06-15       Impact factor: 3.576

2.  Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry.

Authors:  Ahmad Razzaghi; Jafar Mostafavi Amjad; Maniya Maleki
Journal:  Sci Rep       Date:  2020-06-08       Impact factor: 4.379

  2 in total

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