Literature DB >> 25036847

Sputtering deposition of P-type SnO films with SnO₂ target in hydrogen-containing atmosphere.

Po-Ching Hsu1, Chao-Jui Hsu, Ching-Hsiang Chang, Shiao-Po Tsai, Wei-Chung Chen, Hsing-Hung Hsieh, Chung-Chih Wu.   

Abstract

In this work, we had investigated sputtering deposition of p-type SnO using the widely used and robust SnO2 target in a hydrogen-containing reducing atmosphere. The effects of the hydrogen-containing sputtering gas on structures, compositions, optical, and electrical properties of deposited SnOx films were studied. Results show that polycrystalline and SnO-dominant films could be readily obtained by carefully controlling the hydrogen gas ratio in the sputtering gas and the extent of reduction reaction. P-type conductivity was unambiguously observed for SnO-dominant films with traceable Sn components, exhibiting a p-type Hall mobility of up to ∼3 cm(2) V(-1) s(-1). P-type SnO thin-film transistors using such SnO-dominant films were also demonstrated.

Entities:  

Year:  2014        PMID: 25036847     DOI: 10.1021/am5031787

Source DB:  PubMed          Journal:  ACS Appl Mater Interfaces        ISSN: 1944-8244            Impact factor:   9.229


  2 in total

1.  Extremely Sensitive Dependence of SnOx Film Properties on Sputtering Power.

Authors:  Yunpeng Li; Qian Xin; Lulu Du; Yunxiu Qu; He Li; Xi Kong; Qingpu Wang; Aimin Song
Journal:  Sci Rep       Date:  2016-11-08       Impact factor: 4.379

2.  Study on the Effect of Oxygen Defects on the Electrical and Optical Properties of Thin Films.

Authors:  Jin Jeong
Journal:  Scanning       Date:  2018-04-24       Impact factor: 1.932

  2 in total

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