Literature DB >> 25016585

Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope.

Jesus Cantu-Valle1, Francisco Ruiz-Zepeda1, Fernando Mendoza-Santoyo1, Miguel Jose-Yacaman1, Arturo Ponce2.   

Abstract

In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35nm to 2.5μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.
Copyright © 2014 Elsevier B.V. All rights reserved.

Entities:  

Keywords:  Dual-lens imaging; Electron holography; Electron optics; Metallic nanoparticles; Phase reconstruction

Mesh：

Year:  2014        PMID： 25016585      PMCID： PMC4307790          DOI： 10.1016/j.ultramic.2014.06.003

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN： 0304-3991            Impact factor:   2.689


  20 in total

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  3 in total

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