| Literature DB >> 25010695 |
Katerina Lazarova1, Hussein Awala2, Sebastien Thomas3, Marina Vasileva4, Svetlana Mintova5, Tsvetanka Babeva6.
Abstract
The preparation of real">sponsive multilayered structures with qu<span class="Chemical">arter-wave design based on layer-by-layer deposition of sol-gel derived Nb(2)O(5) films and spin-coated MEL type zeolite is demonstrated. The refractive indices (n) and thicknesses (d) of the layers are determined using non-linear curve fitting of the measured reflectance spectra. Besides, the surface and cross-sectional features of the multilayered structures are characterized by scanning electron microscopy (SEM). The quasi-omnidirectional photonic band for the multilayered structures is predicted theoretically, and confirmed experimentally by reflectance measurements at oblique incidence with polarized light. The sensing properties of the multilayered structures toward acetone are studied by measuring transmittance spectra prior and after vapor exposure. Furthermore, the potential of the one-dimensional photonic crystals based on the multilayered structure consisting of Nb(2)O(5) and MEL type zeolite as a chemical sensor with optical read-out is discussed.Entities:
Year: 2014 PMID: 25010695 PMCID: PMC4168517 DOI: 10.3390/s140712207
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1.Bubbler system for generation of acetone vapor; SP—splitter, FMC1 and FMC2—flow mass controllers, V1 and V2—two path valves, V3 and V4—three path valves, MC—mixing chamber.
Figure 2.SEM cross-section image of (a) 5-layers photonic crystals of alternating Nb2O5 and MEL zeolite films—the Nb2O5 film is the first layer deposited on the Si-substrate; (b) MEL zeolite film is on top of the Nb2O5 film; and (c) Nb2O5 film on top of MEL zeolite film.
Figure 3.Surface morphology of (a) single MEL zeolite film deposited on Si-substrate and (b) PhC consisting of five layers of alternating Nb2O5 and MEL zeolite films.
Figure 4.(a) Reflectance spectra at normal incidence of unpolarized light for PhC structures comprising of 2, 3, 5 and 7 layers of alternating Nb2O5 and MEL zeolite films deposited on glass substrate. In all samples the film close to the substrate is Nb2O5; (b) measured and calculated values of maximum reflectance as a function of number of the layers in the stack; and (c) dispersion curves of refractive index for Nb2O5 and MEL zeolite films.
Figure 5.(a) Measured reflection band edges for Rpol = (Rp + Rs)/2 at levels of 60% as a function of the incident angle. Measured reflectance spectra Rpol of PhC comprising 7 alternating layers of Nb2O5 and MEL zeolites as a function of wavelength at incident angles (b) 0°, (c) 50° and (d) 70°. The shaded area represents the quasi-ODR band for the angular range 0°–70°.
Figure 6.Kinetics of transmittance changes for a sensor comprising two (blue line), three (green line), five (black line) and seven (red line) alternating Nb2O5 and MEL zeolite films annealed at 320 °C (a) and 450 °C (b) within 3 cycles of adsorption and desorption of acetone at room temperature.
Figure 7.Time constants of adsorption (a) and desorption (b) of photonic structures comprising different number of layers annealed at 320 °C and 450 °C; and (c) calculated and measured changes of T as a function of number of the layers in the structures annealed at 320 °C and 450 °C.