Literature DB >> 25006261

4D multiple-cathode ultrafast electron microscopy.

John Spencer Baskin1, Haihua Liu1, Ahmed H Zewail2.   

Abstract

Four-dimensional multiple-cathode ultrafast electron microscopy is developed to enable the capture of multiple images at ultrashort time intervals for a single microscopic dynamic process. The dynamic process is initiated in the specimen by one femtosecond light pulse and probed by multiple packets of electrons generated by one UV laser pulse impinging on multiple, spatially distinct, cathode surfaces. Each packet is distinctly recorded, with timing and detector location controlled by the cathode configuration. In the first demonstration, two packets of electrons on each image frame (of the CCD) probe different times, separated by 19 picoseconds, in the evolution of the diffraction of a gold film following femtosecond heating. Future elaborations of this concept to extend its capabilities and expand the range of applications of 4D ultrafast electron microscopy are discussed. The proof-of-principle demonstration reported here provides a path toward the imaging of irreversible ultrafast phenomena of materials, and opens the door to studies involving the single-frame capture of ultrafast dynamics using single-pump/multiple-probe, embedded stroboscopic imaging.

Entities:  

Keywords:  electron pulse generation; irreversible dynamics; ultrafast imaging

Year:  2014        PMID: 25006261      PMCID: PMC4115550          DOI: 10.1073/pnas.1411650111

Source DB:  PubMed          Journal:  Proc Natl Acad Sci U S A        ISSN: 0027-8424            Impact factor:   11.205


  7 in total

Review 1.  Four-dimensional electron microscopy.

Authors:  Ahmed H Zewail
Journal:  Science       Date:  2010-04-09       Impact factor: 47.728

2.  Atomic-scale imaging in real and energy space developed in ultrafast electron microscopy.

Authors:  Hyun Soon Park; J Spencer Baskin; Oh-Hoon Kwon; Ahmed H Zewail
Journal:  Nano Lett       Date:  2007-07-10       Impact factor: 11.189

3.  4D imaging of transient structures and morphologies in ultrafast electron microscopy.

Authors:  Brett Barwick; Hyun Soon Park; Oh-Hoon Kwon; J Spencer Baskin; Ahmed H Zewail
Journal:  Science       Date:  2008-11-21       Impact factor: 47.728

4.  Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope.

Authors:  Thomas LaGrange; Bryan W Reed; Melissa K Santala; Joseph T McKeown; Andreas Kulovits; Jörg M K Wiezorek; Liliya Nikolova; Federico Rosei; Bradely J Siwick; Geoffrey H Campbell
Journal:  Micron       Date:  2012-04-28       Impact factor: 2.251

5.  Photon-induced near-field electron microscopy.

Authors:  Brett Barwick; David J Flannigan; Ahmed H Zewail
Journal:  Nature       Date:  2009-12-17       Impact factor: 49.962

6.  4D electron microscopy: principles and applications.

Authors:  David J Flannigan; Ahmed H Zewail
Journal:  Acc Chem Res       Date:  2012-09-11       Impact factor: 22.384

7.  4D ultrafast electron microscopy: imaging of atomic motions, acoustic resonances, and moiré fringe dynamics.

Authors:  Hyun Soon Park; J Spencer Baskin; Brett Barwick; Oh-Hoon Kwon; Ahmed H Zewail
Journal:  Ultramicroscopy       Date:  2009-08-29       Impact factor: 2.689

  7 in total

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