Literature DB >> 24956406

Selective removal of metallic single-walled carbon nanotubes in full length by organic film-assisted electrical breakdown.

Keigo Otsuka1, Taiki Inoue, Shohei Chiashi, Shigeo Maruyama.   

Abstract

An organic film-assisted electrical breakdown technique is proposed to selectively remove metallic (m-) single-walled carbon nanotubes (SWNTs) in full length towards creation of pure semiconducting SWNT arrays which are available for the large-scale fabrication of field effect transistors (FETs). The electrical breakdown of horizontally aligned SWNT arrays embedded in organic films resulted in a maximum removal length of 16.4 μm. The removal of SWNTs was confirmed using scanning electron microscopy and Raman mapping measurements. The on/off ratios of FETs were improved up to ca. 10,000, similar to that achieved for in-air breakdown. The experimental results suggest that exothermic oxidation of organic films induces propagation of oxidation reaction, hence the long-length removal of m-SWNTs.

Entities:  

Year:  2014        PMID: 24956406     DOI: 10.1039/c4nr01690d

Source DB:  PubMed          Journal:  Nanoscale        ISSN: 2040-3364            Impact factor:   7.790


  4 in total

1.  Selective breakdown of metallic pathways in double-walled carbon nanotube networks.

Authors:  Allen L Ng; Yong Sun; Lyndsey Powell; Chuan-Fu Sun; Chien-Fu Chen; Cheng S Lee; YuHuang Wang
Journal:  Small       Date:  2014-09-02       Impact factor: 13.281

Review 2.  Gel Chromatography for Separation of Single-Walled Carbon Nanotubes.

Authors:  Sunwoo Kim; Woo-Jae Kim
Journal:  Gels       Date:  2022-01-24

3.  Dielectrophoresis-Based Positioning of Carbon Nanotubes for Wafer-Scale Fabrication of Carbon Nanotube Devices.

Authors:  Joevonte Kimbrough; Lauren Williams; Qunying Yuan; Zhigang Xiao
Journal:  Micromachines (Basel)       Date:  2020-12-25       Impact factor: 2.891

Review 4.  Critical challenges and advances in the carbon nanotube-metal interface for next-generation electronics.

Authors:  Farhad Daneshvar; Hengxi Chen; Kwanghae Noh; Hung-Jue Sue
Journal:  Nanoscale Adv       Date:  2021-01-06
  4 in total

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