| Literature DB >> 24923858 |
Yanwen Wu1, Chengdong Zhang, N Mohammadi Estakhri, Yang Zhao, Jisun Kim, Matt Zhang, Xing-Xiang Liu, Greg K Pribil, Andrea Alù, Chih-Kang Shih, Xiaoqin Li.
Abstract
Using atomically smooth epitaxial silver films, new optical permittivity highlighting significant loss reduction in the visible frequency range is extracted. Largely enhanced propagation distances of surface plasmon polaritons are measured, confirming the low intrinsic loss in silver. The new permittivity is free of extrinsic spectral features associated with grain boundaries and localized plasmons inevitably present in thermally deposited films.Entities:
Keywords: ellipsometry; epitaxial growth; optical constants; plasmon
Year: 2014 PMID: 24923858 DOI: 10.1002/adma.201401474
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849