Literature DB >> 24912807

Negative-tone block copolymer lithography by in situ surface chemical modification.

Bong Hoon Kim1, Kyeong-Jae Byeon, Ju Young Kim, Jinseung Kim, Hyeong Min Jin, Joong-Yeon Cho, Seong-Jun Jeong, Jonghwa Shin, Heon Lee, Sang Ouk Kim.   

Abstract

Negative-tone block copolymer (BCP) lithography based on in situ surface chemical modification is introduced as a highly efficient, versatile self-assembled nanopatterning. BCP blends films consisting of end-functionalized low molecular weight poly(styrene-ran-methyl methacrylate) and polystyrene-block-Poly(methyl methacylate) can produce surface vertical BCP nanodomains on various substrates without prior surface chemical treatment. Simple oxygen plasma treatment is employed to activate surface functional group formation at various substrates, where the end-functionalized polymers can be covalently bonded during the thermal annealing of BCP thin films. The covalently bonded brush layer mediates neutral interfacial condition for vertical BCP nanodomain alignment. This straightforward approach for high aspect ratio, vertical self-assembled nanodomain formation facilitates single step, site-specific BCP nanopatterning widely useful for various substrates. Moreover, this approach is compatible with directed self-assembly approaches to produce device oriented laterally ordered nanopatterns.
© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Entities:  

Keywords:  block copolymers; imprint; lithography; self-assembly

Year:  2014        PMID: 24912807     DOI: 10.1002/smll.201400971

Source DB:  PubMed          Journal:  Small        ISSN: 1613-6810            Impact factor:   13.281


  2 in total

Review 1.  Multifunctional Structured Platforms: From Patterning of Polymer-Based Films to Their Subsequent Filling with Various Nanomaterials.

Authors:  Madalina Handrea-Dragan; Ioan Botiz
Journal:  Polymers (Basel)       Date:  2021-01-30       Impact factor: 4.329

2.  A route to engineered high aspect-ratio silicon nanostructures through regenerative secondary mask lithography.

Authors:  Martyna Michalska; Sophia K Laney; Tao Li; Manish K Tiwari; Ivan P Parkin; Ioannis Papakonstantinou
Journal:  Nanoscale       Date:  2022-02-03       Impact factor: 8.307

  2 in total

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