Literature DB >> 24877653

Effect of channel layer thickness on the performance of indium-zinc-tin oxide thin film transistors manufactured by inkjet printing.

Christophe Avis1, Hye Rim Hwang, Jin Jang.   

Abstract

We report the fabrication of high field-effect mobility of ∼110 cm(2)/(V s) for inkjet printed indium-zinc-tin oxide (IZTO) thin film transistors (TFTs). It is found that the morphology of IZTO material deposited by inkjet printing depends strongly on its thickness. When the thickness is 35 nm, IZTO is an homogeneous amorphous material and the TFT exhibits mobility over 100 cm(2)/(V s) and on/off current ratio of >10(6). However, when the thickness is 85 nm, IZTO has a two layer structure of homogeneous and heterogeneous materials and thus the TFT exhibited a mobility of ∼20 cm(2)/(V s). When the thickness is 800 nm, the morphology is porous and heterogeneous and thus the on/off current ratio is less than 1 × 10(3) and its mobility is ∼14 cm(2)/(V s). It is concluded therefore that homogeneous amorphous IZTO TFT on Al2O3 gate insulator can show high mobility, which can be achieved by thin layer formation by inkjet printing.

Entities:  

Year:  2014        PMID: 24877653     DOI: 10.1021/am501153w

Source DB:  PubMed          Journal:  ACS Appl Mater Interfaces        ISSN: 1944-8244            Impact factor:   9.229


  4 in total

1.  Low-Temperature, Solution-Processed, Transparent Zinc Oxide-Based Thin-Film Transistors for Sensing Various Solvents.

Authors:  Hsin-Chiang You; Cheng-Jyun Wang
Journal:  Materials (Basel)       Date:  2017-02-26       Impact factor: 3.623

2.  Drain Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors with Different Active Layer Thicknesses.

Authors:  Dapeng Wang; Wenjing Zhao; Hua Li; Mamoru Furuta
Journal:  Materials (Basel)       Date:  2018-04-05       Impact factor: 3.623

3.  Exploring the photoleakage current and photoinduced negative bias instability in amorphous InGaZnO thin-film transistors with various active layer thicknesses.

Authors:  Dapeng Wang; Mamoru Furuta
Journal:  Beilstein J Nanotechnol       Date:  2018-09-26       Impact factor: 3.649

4.  Amorphous Tin Oxide Applied to Solution Processed Thin-Film Transistors.

Authors:  Christophe Avis; YounGoo Kim; Jin Jang
Journal:  Materials (Basel)       Date:  2019-10-14       Impact factor: 3.623

  4 in total

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