Estimating diffusion parameters from polarized spherical-gradient illumination.

The proposed method acquires subsurface-scattering parameters of heterogeneous translucent materials. It directly obtains dense per-surface-point scattering parameters from observations under cross-polarized spherical-gradient illumination of curved surfaces. This method does not require explicit fitting of observed scattering profiles. A variety of heterogeneous translucent objects illustrate its validity.