Literature DB >> 24787171

Thermal stability studies of short period Sc/Cr and Sc/B₄C/Cr multilayers.

Mauro Prasciolu, Adam F G Leontowich, Kenneth R Beyerlein, Saša Bajt.   

Abstract

The stability of short period Sc/Cr and Sc/B₄C/Cr multilayers was investigated over a large temperature range. The aim was to find a stable reflective coating for an off-axis parabola for focusing x rays from a soft x-ray free-electron laser. Normal incidence reflectivity, surface roughness, and intrinsic stress were investigated as a function of annealing temperature and two samples were also studied with a high-resolution transmission electron microscope (TEM), a scanning TEM, and through electron energy loss spectroscopy (EELS). Interface-engineered Sc/B₄C/Cr multilayers showed increased thermal stability and higher reflectivity as compared to pure Sc/Cr multilayers.

Entities:  

Year:  2014        PMID: 24787171     DOI: 10.1364/AO.53.002126

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  2 in total

1.  Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurements.

Authors:  Anton Haase; Saša Bajt; Philipp Hönicke; Victor Soltwisch; Frank Scholze
Journal:  J Appl Crystallogr       Date:  2016-11-24       Impact factor: 3.304

2.  High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region.

Authors:  Qiushi Huang; Qiang Yi; Zhaodong Cao; Runze Qi; Rolf A Loch; Philippe Jonnard; Meiyi Wu; Angelo Giglia; Wenbin Li; Eric Louis; Fred Bijkerk; Zhong Zhang; Zhanshan Wang
Journal:  Sci Rep       Date:  2017-10-10       Impact factor: 4.379

  2 in total

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