Literature DB >> 24784689

Note: switching crosstalk on and off in Kelvin Probe Force Microscopy.

Leo Polak1, Sven de Man2, Rinke J Wijngaarden1.   

Abstract

In Kelvin Probe Force Microscopy (KPFM) electronic crosstalk can occur between the excitation signal and probe deflection signal. Here, we demonstrate how a small modification to our commercial instrument enables us to literally switch the crosstalk on and off. We study in detail the effect of crosstalk on open-loop KPFM and compare with closed-loop KPFM. We measure the pure crosstalk signal and verify that we can correct for it in the data-processing required for open-loop KPFM. We also demonstrate that open-loop KPFM results are independent of the frequency and amplitude of the excitation signal, provided that the influence of crosstalk has been eliminated.

Year:  2014        PMID: 24784689     DOI: 10.1063/1.4873331

Source DB:  PubMed          Journal:  Rev Sci Instrum        ISSN: 0034-6748            Impact factor:   1.523


  4 in total

1.  High-speed digitization of the amplitude and frequency in open-loop sideband frequency-modulation Kelvin probe force microscopy.

Authors:  Gheorghe Stan
Journal:  Nanotechnology       Date:  2020-06-09       Impact factor: 3.874

2.  Kelvin probe force microscopy in liquid using electrochemical force microscopy.

Authors:  Liam Collins; Stephen Jesse; Jason I Kilpatrick; Alexander Tselev; M Baris Okatan; Sergei V Kalinin; Brian J Rodriguez
Journal:  Beilstein J Nanotechnol       Date:  2015-01-19       Impact factor: 3.649

3.  Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices.

Authors:  Amelie Axt; Ilka M Hermes; Victor W Bergmann; Niklas Tausendpfund; Stefan A L Weber
Journal:  Beilstein J Nanotechnol       Date:  2018-06-15       Impact factor: 3.649

4.  Kelvin probe force microscopy for local characterisation of active nanoelectronic devices.

Authors:  Tino Wagner; Hannes Beyer; Patrick Reissner; Philipp Mensch; Heike Riel; Bernd Gotsmann; Andreas Stemmer
Journal:  Beilstein J Nanotechnol       Date:  2015-11-23       Impact factor: 3.649

  4 in total

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