| Literature DB >> 24748691 |
Stefan Gerhold1, Zhiming Wang1, Michael Schmid1, Ulrike Diebold1.
Abstract
Controlling the surface structure on the atomic scale is a major difficulty for most transition metal oxides; this is especially true for the ternary perovskites. The influence of surface stoichiometry on the atomic structure of the SrTiO3(001) surface was examined with scanning tunneling microscopy, low-energy electron diffraction, low-energy He+ ion scattering (LEIS), and X-ray photoelectron spectroscopy (XPS). Vapor deposition of 0.8 monolayer (ML) strontium and 0.3 ML titanium, with subsequent annealing to 850 °C in 4 × 10- 6 mbar O2, reversibly switches the surface between c(4 × 2) and (2 × 2) reconstructions, respectively. The combination of LEIS and XPS shows a different stoichiometry that is confined to the top layer. Geometric models for these reconstructions need to take into account these different surface compositions.Entities:
Keywords: Low energy electron diffraction; Low energy ion scattering; Scanning tunneling microscopy; Strontium titanate; Surface stoichiometry; X-ray photoelectron spectroscopy
Year: 2014 PMID: 24748691 PMCID: PMC3990415 DOI: 10.1016/j.susc.2013.10.015
Source DB: PubMed Journal: Surf Sci ISSN: 0039-6028 Impact factor: 1.942
Fig. 1Large-scale STM images (200 × 200 nm2) of differently reconstructed STO(001) surfaces. The insets show the LEED patterns at an electron energy of 69 eV. (a) Multiple sputtering and annealing cycles produce the two-domain c(4 × 2) surface (tunneling parameters: Vs = + 3.5 V, It = 0.48 nA). An atomically resolved STM image and the corresponding FFT are shown at the side of (a). (b) Deposition of Sr with subsequent annealing changes the reconstruction to a (2 × 2) structure (tunneling parameters: Vs = + 2.3 V, It = 0.26 nA). Ti deposition and annealing revert the surface to the c(4 × 2) structure. Note that the step edges are different in (a) and (b).
Fig. 2(a) XPS spectra (Mg Kα with hν = 1254 eV, normal emission) and (b) LEIS spectra (averaged over 10 scans) (He+ with 1 keV, scattering angle θ = 137°) of SrTiO3(001) (2 × 2) and c(4 × 2) reconstructed surfaces. The Sr to Ti peak intensity ratios are listed in Table 1.
Ratio of Sr and Ti peak intensities of the two different reconstructions measured with LEIS and XPS. The ratio was calculated by integrating the intensities of the characteristic peaks in XPS (Sr3d5/2 to Ti2p3/2; after subtracting a Shirley background) and LEIS (Sr to Ti; after subtracting a linear background) spectra.
| Intensity Sr/Ti | (2 × 2) | c(4 × 2) |
|---|---|---|
| XPS | 1.03 ± 0.02 | 1.06 ± 0.02 |
| LEIS | 1.70 ± 0.20 | 1.29 ± 0.15 |