| Literature DB >> 24740439 |
You Seung Rim1, Huajun Chen, Xiaolu Kou, Hsin-Sheng Duan, Huanping Zhou, Min Cai, Hyun Jae Kim, Yang Yang.
Abstract
Entities:
Keywords: oxide semiconductor; solution-process; structural properties; thin-film transistor
Year: 2014 PMID: 24740439 DOI: 10.1002/adma.201400529
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849