| Literature DB >> 24720757 |
Alexander Eifert1, Christine Kranz.
Abstract
Atomic force microscopy can be readily combined with complementary instrumental techniques ranging from optical to mass-sensitive methods. This Feature highlights recent advances on hyphenated AFM technology, which enables localized studies and mapping of complementary information at surfaces and interfaces.Year: 2014 PMID： 24720757 DOI： 10.1021/ac5008128
Source DB: PubMed Journal: Anal Chem ISSN： 0003-2700 Impact factor: 6.986