| Literature DB >> 24709956 |
Richard Hahnkee Kim1, Hae Jin Kim2, Insung Bae3, Sun Kak Hwang3, Dhinesh Babu Velusamy3, Suk Man Cho3, Kazuto Takaishi4, Tsuyoshi Muto4, Daisuke Hashizume5, Masanobu Uchiyama4, Pascal André4, Fabrice Mathevet6, Benoit Heinrich7, Tetsuya Aoyama4, Dae-Eun Kim8, Hyungsuk Lee8, Jean-Charles Ribierre9, Cheolmin Park3.
Abstract
High-performance non-volatile memory that can operate under various mechanical deformations such as bending and folding is in great demand for the future smart wearable and foldable electronics. Here we demonstrate non-volatile solution-processed ferroelectric organic field-effect transistor memories operating in p- and n-type dual mode, with excellent mechanical flexibility. Our devices contain a ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) thin insulator layer and use a quinoidal oligothiophene derivative (QQT(CN)4) as organic semiconductor. Our dual-mode field-effect devices are highly reliable with data retention and endurance of >6,000 s and 100 cycles, respectively, even after 1,000 bending cycles at both extreme bending radii as low as 500 μm and with sharp folding involving inelastic deformation of the device. Nano-indentation and nano scratch studies are performed to characterize the mechanical properties of organic layers and understand the crucial role played by QQT(CN)4 on the mechanical flexibility of our devices.Entities:
Year: 2014 PMID: 24709956 DOI: 10.1038/ncomms4583
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919