Literature DB >> 24663568

A 2 D high accuracy slope measuring system based on a Stitching Shack Hartmann Optical Head.

Mourad Idir, Konstantine Kaznatcheev, Guillaume Dovillaire, Jerome Legrand, Rakchanok Rungsawang.   

Abstract

We present a 2D Slope measuring System based on a Stitching Shack Hartmann Optical Head (SSH-OH) aiming to perform high accuracy optical metrology for X-ray mirrors. This system was developed to perform high-accuracy automated metrology for extremely high quality optical components needed for synchrotrons or Free Electrons Lasers (FEL), EUV lithography and x-ray astronomy with slope error accuracy better than 50 nrad rms.

Entities:  

Year:  2014        PMID: 24663568     DOI: 10.1364/OE.22.002770

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  2 in total

1.  Multi-beam array stitching method based on scanning Hartmann for imaging quality evaluation of large space telescopes.

Authors:  Haisong Wei; Haixiang Hu; Feng Yan; Xindong Chen; Qiang Cheng; Donglin Xue; Xuejun Zhang
Journal:  Sci Rep       Date:  2018-05-08       Impact factor: 4.379

2.  X-ray free-electron laser wavefront sensing using the fractional Talbot effect.

Authors:  Yanwei Liu; Matthew Seaberg; Yiping Feng; Kenan Li; Yuantao Ding; Gabriel Marcus; David Fritz; Xianbo Shi; Walan Grizolli; Lahsen Assoufid; Peter Walter; Anne Sakdinawat
Journal:  J Synchrotron Radiat       Date:  2020-02-12       Impact factor: 2.616

  2 in total

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