| Literature DB >> 24663541 |
Hang Guan, Ari Novack, Matthew Streshinsky, Ruizhi Shi, Qing Fang, Andy Eu-Jin Lim, Guo-Qiang Lo, Tom Baehr-Jones, Michael Hochberg.
Abstract
We present a highly efficient polarization splitter and rotator (PSR), fabricated using 248 nm deep ultraviolet lithography on a silicon-on-insulator substrate. The PSR is based on a double-etched directional coupler with a length of 27 µm. The fabricated PSR yields a TM-to-TE conversion loss better than 0.5 dB and TE insertion loss better than 0.3 dB, with an ultra-low crosstalk (-20 dB) in the wavelength regime 1540-1570 nm.Entities:
Year: 2014 PMID: 24663541 DOI: 10.1364/OE.22.002489
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894