Literature DB >> 24647057

[Development of an attitude-measurement questionnaire using the semantic differential technique: defining the attitudes of radiological technology students toward X-ray examination].

Naomi Tamura1, Takayoshi Terashita, Katsuhiko Ogasawara.   

Abstract

BACKGROUND: In general, it is difficult to objectively evaluate the results of an educational program. The semantic differential (SeD) technique, a methodology used to measure the connotative meaning of objects, words, and concepts, can, however, be applied to the evaluation of students' attitudes. In this study, we aimed to achieve an objective evaluation of the effects of radiological technology education. We therefore investigated the attitude of radiological students using the SeD technique. We focused on X-ray examinations in the field of radiological technology science.
METHODS: Bipolar adjective scales were used for the SeD questionnaire. To create the questionnaire, appropriate adjectives were selected from past reports of X-ray examination practice. The participants were 32 senior students at Hokkaido University at the Division of Radiological Technology at the School of Medicine's Department of Health Sciences. All the participants completed the questionnaire. The study was conducted in early June 2012. Attitudes toward X-ray examination were identified using a factor analysis of 11 adjectives.
RESULTS: The factor analysis revealed the following three attitudes: feelings of expectation, responsibility, and resistance. Knowledge regarding the attitudes that students have toward X-ray examination will prove useful for evaluating the effects of educational intervention. In this study, a sampling bias may have occurred due to the small sample size; however, no other biases were observed.

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Year:  2014        PMID: 24647057     DOI: 10.6009/jjrt.2014_jsrt_70.3.135

Source DB:  PubMed          Journal:  Nihon Hoshasen Gijutsu Gakkai Zasshi        ISSN: 0369-4305


  1 in total

1.  Initializing and Growing a Database of Health Information Technology (HIT) Events by Using TF-IDF and Biterm Topic Modeling.

Authors:  Hong Kang; Zhiguo Yu; Yang Gong
Journal:  AMIA Annu Symp Proc       Date:  2018-04-16
  1 in total

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