| Literature DB >> 24633394 |
Inga Jordan1, Amaia Beloqui Redondo, Matthew A Brown, Daniel Fodor, Malwina Staniuk, Armin Kleibert, Hans Jakob Wörner, Javier B Giorgi, Jeroen A van Bokhoven.
Abstract
Depth resolved X-ray photoelectron spectroscopy (XPS) combined with a 25 μm liquid jet is used to quantify the spatial distribution of 3 nm SnO2 nanoparticles (NPs) from the air-water interface (AWI) into the suspension bulk. Results are consistent with those of a layer several nm thick at the AWI that is completely devoid of NPs.Entities:
Year: 2014 PMID： 24633394 DOI： 10.1039/c4cc00720d
Source DB: PubMed Journal: Chem Commun (Camb) ISSN： 1359-7345 Impact factor: 6.222