Literature DB >> 24628698

Unique determination of "subatomic" contrast by imaging covalent backbonding.

Adam Sweetman1, Philipp Rahe, Philip Moriarty.   

Abstract

The origin of so-called "subatomic" resolution in dynamic force microscopy has remained controversial since its first observation in 2000. A number of detailed experimental and theoretical studies have identified different possible physicochemical mechanisms potentially giving rise to subatomic contrast. In this study, for the first time we are able to assign the origin of a specific instance of subatomic contrast as being due to the back bonding of a surface atom in the tip-sample junction.

Year:  2014        PMID: 24628698     DOI: 10.1021/nl4041803

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  3 in total

1.  Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting.

Authors:  Hongqian Sang; Samuel P Jarvis; Zhichao Zhou; Peter Sharp; Philip Moriarty; Jianbo Wang; Yu Wang; Lev Kantorovich
Journal:  Sci Rep       Date:  2014-10-20       Impact factor: 4.379

2.  Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface.

Authors:  Hatem Labidi; Mohammad Koleini; Taleana Huff; Mark Salomons; Martin Cloutier; Jason Pitters; Robert A Wolkow
Journal:  Nat Commun       Date:  2017-02-13       Impact factor: 14.919

3.  Modelling of 'sub-atomic' contrast resulting from back-bonding on Si(111)-7×7.

Authors:  Adam Sweetman; Samuel P Jarvis; Mohammad A Rashid
Journal:  Beilstein J Nanotechnol       Date:  2016-06-29       Impact factor: 3.649

  3 in total

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