| Literature DB >> 24580465 |
M Zanatta1, G Baldi2, R S Brusa3, W Egger4, A Fontana3, E Gilioli2, S Mariazzi3, G Monaco3, L Ravelli4, F Sacchetti5.
Abstract
Positron annihilation lifetime spectroscopy is employed to measure the size of the interstitial void spaces characterizing the structure of a set of permanently densified SiO2 glasses. The average volume of the voids is markedly affected by the densification process and linearly shrinks by almost an order of magnitude after a relative density variation of 22%. In addition, x-ray diffraction shows that this change of density does not modify appreciably the short range order, which remains organized in SiO4 tetrahedra. These results strongly suggest a porous medium description for v-SiO2 glasses where the compressibility and the medium range order are dominated by the density variation of the voids volume up to densities close to that of α-quartz.Entities:
Year: 2014 PMID: 24580465 DOI: 10.1103/PhysRevLett.112.045501
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161