Literature DB >> 24515006

Hole injection and electron overflow improvement in InGaN/GaN light-emitting diodes by a tapered AlGaN electron blocking layer.

Bing-Chen Lin, Kuo-Ju Chen, Chao-Hsun Wang, Ching-Hsueh Chiu, Yu-Pin Lan, Chien-Chung Lin, Po-Tsung Lee, Min-Hsiung Shih, Yen-Kuang Kuo, Hao-Chung Kuo.   

Abstract

A tapered AlGaN electron blocking layer with step-graded aluminum composition is analyzed in nitride-based blue light-emitting diode (LED) numerically and experimentally. The energy band diagrams, electrostatic fields, carrier concentration, electron current density profiles, and hole transmitting probability are investigated. The simulation results demonstrated that such tapered structure can effectively enhance the hole injection efficiency as well as the electron confinement. Consequently, the LED with a tapered EBL grown by metal-organic chemical vapor deposition exhibits reduced efficiency droop behavior of 29% as compared with 44% for original LED, which reflects the improvement in hole injection and electron overflow in our design.

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Year:  2014        PMID: 24515006     DOI: 10.1364/OE.22.000463

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  3 in total

1.  Improved carrier injection of AlGaN-based deep ultraviolet light emitting diodes with graded superlattice electron blocking layers.

Authors:  Byeongchan So; Jinwan Kim; Taemyung Kwak; Taeyoung Kim; Joohyoung Lee; Uiho Choi; Okhyun Nam
Journal:  RSC Adv       Date:  2018-10-16       Impact factor: 4.036

2.  Anomalous Photocurrent Reversal Due to Hole Traps in AlGaN-Based Deep-Ultraviolet Light-Emitting Diodes.

Authors:  Seungyoung Lim; Tae-Soo Kim; Jaesang Kang; Jaesun Kim; Minhyup Song; Hyun Deok Kim; Jung-Hoon Song
Journal:  Micromachines (Basel)       Date:  2022-07-31       Impact factor: 3.523

3.  Calculating the Effect of AlGaN Dielectric Layers in a Polarization Tunnel Junction on the Performance of AlGaN-Based Deep-Ultraviolet Light-Emitting Diodes.

Authors:  Yong Wang; Zihui Zhang; Long Guo; Yuxuan Chen; Yahui Li; Zhanbin Qi; Jianwei Ben; Xiaojuan Sun; Dabing Li
Journal:  Nanomaterials (Basel)       Date:  2021-12-07       Impact factor: 5.076

  3 in total

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