John J Kasianowicz1. 1. National Institute of Standards and Technology, Physical Measurement Laboratory, Semiconductor and Dimensional Metrology Division, CMOS Reliability & Advanced Devices Group, Gaithersburg, Maryland 20899, United States.
Authors: Lukáš Pravda; Karel Berka; Radka Svobodová Vařeková; David Sehnal; Pavel Banáš; Roman A Laskowski; Jaroslav Koča; Michal Otyepka Journal: BMC Bioinformatics Date: 2014-11-18 Impact factor: 3.169
Authors: Natalie L Mutter; Jana Volarić; Wiktor Szymanski; Ben L Feringa; Giovanni Maglia Journal: J Am Chem Soc Date: 2019-08-30 Impact factor: 15.419