| Literature DB >> 24392670 |
Sergii Pud1, Jing Li, Volodymyr Sibiliev, Mykhaylo Petrychuk, Valery Kovalenko, Andreas Offenhäusser, Svetlana Vitusevich.
Abstract
We employ noise spectroscopy and transconductance measurements to establish the optimal regimes of operation for our fabricated silicon nanowire field-effect transistors (Si NW FETs) sensors. A strong coupling between the liquid gate and back gate (the substrate) has been revealed and used for optimization of signal-to-noise ratio in subthreshold as well as above-threshold regimes. Increasing the sensitivity of Si NW FET sensors above the detection limit has been predicted and proven by direct experimental measurements.Entities:
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Year: 2014 PMID: 24392670 DOI: 10.1021/nl403748x
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189