Literature DB >> 24366553

Evolution of the shape of the conducting channel in complementary resistive switching transition metal oxides.

Kyung Jean Yoon1, Seul Ji Song, Jun Yeong Seok, Jung Ho Yoon, Tae Hyung Park, Dae Eun Kwon, Cheol Seong Hwang.   

Abstract

Ultimate control of the defect distribution and local conduction path in a bipolar resistive switching (BRS) Pt/TiO2/Pt sample, which was in a unipolar reset state, is provided by means of voltage pulsing and the resulting time-transient current analysis. The limited amount of oxygen vacancies in this system allowed reversibly switching-diode-like current-voltage curves, which was also confirmed in another Magnéli-phase-containing Pt/WO3/Pt sample. Such careful control of the defect distribution allowed the achievement of a complementary resistive switching (CRS) curve even from a single switching layer. The unlimited vacancy source in the Pt/TiO2/TiO2-x/Pt sample did not allow the switching-diode type and the CRS behavior. The data retention of the on-state in the BRS was critically dependent on the shape of the rejuvenated conduction channel. The required time to lead to the rejuvenation of the conducting channel was ∼70-100 ns when the threshold voltage for the BRS set of ∼-1 V was applied.

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Year:  2013        PMID: 24366553     DOI: 10.1039/c3nr05426h

Source DB:  PubMed          Journal:  Nanoscale        ISSN: 2040-3364            Impact factor:   7.790


  4 in total

1.  Filament Geometry Induced Bipolar, Complementary, and Unipolar Resistive Switching under the Same Set Current Compliance in Pt/SiOx/TiN.

Authors:  Dong-Hyeok Lim; Ga-Yeon Kim; Jin-Ho Song; Kwang-Sik Jeong; Dae-Hong Ko; Mann-Ho Cho
Journal:  Sci Rep       Date:  2015-10-22       Impact factor: 4.379

2.  Dual conical conducting filament model in resistance switching TiO2 thin films.

Authors:  Kyung Min Kim; Tae Hyung Park; Cheol Seong Hwang
Journal:  Sci Rep       Date:  2015-01-19       Impact factor: 4.379

3.  Resistance switching behavior of atomic layer deposited SrTiO3 film through possible formation of Sr2Ti6O13 or Sr1Ti11O20 phases.

Authors:  Woongkyu Lee; Sijung Yoo; Kyung Jean Yoon; In Won Yeu; Hye Jung Chang; Jung-Hae Choi; Susanne Hoffmann-Eifert; Rainer Waser; Cheol Seong Hwang
Journal:  Sci Rep       Date:  2016-02-02       Impact factor: 4.379

Review 4.  Status and Prospects of ZnO-Based Resistive Switching Memory Devices.

Authors:  Firman Mangasa Simanjuntak; Debashis Panda; Kung-Hwa Wei; Tseung-Yuen Tseng
Journal:  Nanoscale Res Lett       Date:  2016-08-19       Impact factor: 4.703

  4 in total

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