Literature DB >> 24365923

Study on the reflectivity properties of spherically bent analyser crystals.

Ari-Pekka Honkanen1, Roberto Verbeni2, Laura Simonelli2, Marco Moretti Sala2, Giulio Monaco2, Simo Huotari1.   

Abstract

Theoretical and experimental studies are presented on properties of spherically bent analyser crystals for high-resolution X-ray spectrometry. A correction to the bent-crystal strain field owing to its finite surface area is derived. The results are used to explain the reflectivity curves and anisotropic properties of Si(660) and Si(553) analysers in near-backscattering geometry. The results from the calculation agree very well with experimental results obtained using an inelastic X-ray scattering synchrotron beamline.

Entities:  

Keywords:  bent crystals; high-energy-resolution analysers; inelastic X-ray scattering

Year:  2013        PMID： 24365923     DOI： 10.1107/S160057751302242X

Source DB:  PubMed          Journal:  J Synchrotron Radiat        ISSN： 0909-0495            Impact factor:   2.616


  2 in total

1.  Planning, performing and analyzing X-ray Raman scattering experiments.

Authors:  Ch J Sahle; A Mirone; J Niskanen; J Inkinen; M Krisch; S Huotari
Journal:  J Synchrotron Radiat       Date:  2015-02-03       Impact factor: 2.616

2.  Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors.

Authors:  Ari Pekka Honkanen; Roberto Verbeni; Laura Simonelli; Marco Moretti Sala; Ali Al-Zein; Michael Krisch; Giulio Monaco; Simo Huotari
Journal:  J Synchrotron Radiat       Date:  2014-06-12       Impact factor: 2.616
  2 in total

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