Literature DB >> 24347743

Fundamental studies of molecular depth profiling using organic delta layers as model systems.

C Lu1, A Wucher2, N Winograd1.   

Abstract

Alternating Langmuir-Blodgett multilayers of barium arachidate (AA) and barium dimyristoyl phosphatidate (DMPA) were used to elucidate the factors that control depth resolution in molecular depth profiling experiments. More specifically, thin (4.4 nm) layers of DMPA were embedded in relatively thick (~50 nm) multilayer stacks of AA, resulting in a well-defined delta-layer model system closely resembling a biological membrane. This system was subjected to a three-dimensional imaging depth profile analysis using a focused buckminsterfullerene (C60) cluster ion beam. The depth response function measured in these experiments exhibits similar features as those determined in inorganic depth profiling: namely, an asymmetric shape with quasi-exponential leading and trailing edges and a central Gaussian peak. The magnitude of the corresponding characteristic rise and decay lengths is found to be 5 and 16 nm, respectively, while the total half width of the response function characterizing the apparent depth resolution was about 29 nm. Ion-induced mixing is proposed to be largely responsible for the broadening, rather than topography, as determined by atomic force microscopy.

Entities:  

Keywords:  C60; Langmuir-Blodgett film; SIMS; delta layer; molecular depth profiling

Year:  2011        PMID: 24347743      PMCID: PMC3863431          DOI: 10.1002/sia.3409

Source DB:  PubMed          Journal:  Surf Interface Anal        ISSN: 0142-2421            Impact factor:   1.607


  8 in total

1.  Depth profiling of peptide films with TOF-SIMS and a C60 probe.

Authors:  Juan Cheng; Nicholas Winograd
Journal:  Anal Chem       Date:  2005-06-01       Impact factor: 6.986

2.  Molecular depth profiling with cluster ion beams.

Authors:  Juan Cheng; Andreas Wucher; Nicholas Winograd
Journal:  J Phys Chem B       Date:  2006-04-27       Impact factor: 2.991

3.  TOF-SIMS 3D biomolecular imaging of Xenopus laevis oocytes using buckminsterfullerene (C60) primary ions.

Authors:  John S Fletcher; Nicholas P Lockyer; Seetharaman Vaidyanathan; John C Vickerman
Journal:  Anal Chem       Date:  2007-02-16       Impact factor: 6.986

4.  Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS.

Authors:  Alexander G Shard; Felicia M Green; Paul J Brewer; Martin P Seah; Ian S Gilmore
Journal:  J Phys Chem B       Date:  2008-02-07       Impact factor: 2.991

5.  Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a VAMAS interlaboratory study.

Authors:  P Sjövall; D Rading; S Ray; L Yang; A G Shard
Journal:  J Phys Chem B       Date:  2010-01-21       Impact factor: 2.991

6.  Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry.

Authors:  Leiliang Zheng; Andreas Wucher; Nicholas Winograd
Journal:  J Am Soc Mass Spectrom       Date:  2008-01       Impact factor: 3.109

7.  Bioimaging TOF-SIMS: High resolution 3D imaging of single cells.

Authors:  Håkan Nygren; Birgit Hagenhoff; Per Malmberg; Mikael Nilsson; Katrin Richter
Journal:  Microsc Res Tech       Date:  2007-11       Impact factor: 2.769

8.  Depth resolution during C60+ profiling of multilayer molecular films.

Authors:  Leiliang Zheng; Andreas Wucher; Nicholas Winograd
Journal:  Anal Chem       Date:  2008-09-06       Impact factor: 6.986

  8 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.