| Literature DB >> 24289398 |
Julian Stirling1, Richard A J Woolley, Philip Moriarty.
Abstract
We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data on surface structure.Year: 2013 PMID: 24289398 DOI: 10.1063/1.4827076
Source DB: PubMed Journal: Rev Sci Instrum ISSN: 0034-6748 Impact factor: 1.523