Literature DB >> 24274915

A model to systematically employ professional judgment in the Bayesian Decision Analysis for a semiconductor industry exposure assessment.

Craig Torres1, Rachael Jones, Fred Boelter, James Poole, Linda Dell, Paul Harper.   

Abstract

Bayesian Decision Analysis (BDA) uses Bayesian statistics to integrate multiple types of exposure information and classify exposures within the exposure rating categorization scheme promoted in American Industrial Hygiene Association (AIHA) publications. Prior distributions for BDA may be developed from existing monitoring data, mathematical models, or professional judgment. Professional judgments may misclassify exposures. We suggest that a structured qualitative risk assessment (QLRA) method can provide consistency and transparency in professional judgments. In this analysis, we use a structured QLRA method to define prior distributions (priors) for BDA. We applied this approach at three semiconductor facilities in South Korea, and present an evaluation of the performance of structured QLRA for determination of priors, and an evaluation of occupational exposures using BDA. Specifically, the structured QLRA was applied to chemical agents in similar exposure groups to identify provisional risk ratings. Standard priors were developed for each risk rating before review of historical monitoring data. Newly collected monitoring data were used to update priors informed by QLRA or historical monitoring data, and determine the posterior distribution. Exposure ratings were defined by the rating category with the highest probability--i.e., the most likely. We found the most likely exposure rating in the QLRA-informed priors to be consistent with historical and newly collected monitoring data, and the posterior exposure ratings developed with QLRA-informed priors to be equal to or greater than those developed with data-informed priors in 94% of comparisons. Overall, exposures at these facilities are consistent with well-controlled work environments. That is, the 95th percentile of exposure distributions are ≤50% of the occupational exposure limit (OEL) for all chemical-SEG combinations evaluated; and are ≤10% of the limit for 94% of chemical-SEG combinations evaluated.

Entities:  

Keywords:  Bayesian decision analysis; exposure assessment; semiconductor

Mesh:

Substances:

Year:  2014        PMID: 24274915     DOI: 10.1080/15459624.2013.866713

Source DB:  PubMed          Journal:  J Occup Environ Hyg        ISSN: 1545-9624            Impact factor:   2.155


  3 in total

1.  Exposure Reconstruction and Risk Analysis for Six Semiconductor Workers With Lymphohematopoietic Cancers.

Authors:  Rachael M Jones; Linda Dell; Craig Torres; Catherine E Simmons; James Poole; Fred W Boelter; Paul Harper
Journal:  J Occup Environ Med       Date:  2015-06       Impact factor: 2.162

2.  Quantifying Emission Factors and Setting Conditions of Use According to ECHA Chapter R.14 for a Spray Process Designed for Nanocoatings-A Case Study.

Authors:  Antti Joonas Koivisto; Benedetta Del Secco; Sara Trabucco; Alessia Nicosia; Fabrizio Ravegnani; Marko Altin; Joan Cabellos; Irini Furxhi; Magda Blosi; Anna Costa; Jesús Lopez de Ipiña; Franco Belosi
Journal:  Nanomaterials (Basel)       Date:  2022-02-10       Impact factor: 5.076

3.  An integrated approach to assess exposure and health-risk from polycyclic aromatic hydrocarbons (PAHs) in a fastener manufacturing industry.

Authors:  Hsin-I Hsu; Ming-Yeng Lin; Yu-Cheng Chen; Wang-Yi Chen; Chungsik Yoon; Mei-Ru Chen; Perng-Jy Tsai
Journal:  Int J Environ Res Public Health       Date:  2014-09-15       Impact factor: 3.390

  3 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.