Literature DB >> 24256403

Graphene and thin-film semiconductor heterojunction transistors integrated on wafer scale for low-power electronics.

Jinseong Heo1, Kyung-Eun Byun, Jaeho Lee, Hyun-Jong Chung, Sanghun Jeon, Seongjun Park, Sungwoo Hwang.   

Abstract

Graphene heterostructures in which graphene is combined with semiconductors or other layered 2D materials are of considerable interest, as a new class of electronic devices has been realized. Here we propose a technology platform based on graphene-thin-film-semiconductor-metal (GSM) junctions, which can be applied to large-scale and power-efficient electronics compatible with a variety of substrates. We demonstrate wafer-scale integration of vertical field-effect transistors (VFETs) based on graphene-In-Ga-Zn-O (IGZO)-metal asymmetric junctions on a transparent 150 × 150 mm(2) glass. In this system, a triangular energy barrier between the graphene and metal is designed by selecting a metal with a proper work function. We obtain a maximum current on/off ratio (Ion/Ioff) up to 10(6) with an average of 3010 over 2000 devices under ambient conditions. For low-power logic applications, an inverter that combines complementary n-type (IGZO) and p-type (Ge) devices is demonstrated to operate at a bias of only 0.5 V.

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Year:  2013        PMID: 24256403     DOI: 10.1021/nl403142v

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  3 in total

Review 1.  Mixed-dimensional van der Waals heterostructures.

Authors:  Deep Jariwala; Tobin J Marks; Mark C Hersam
Journal:  Nat Mater       Date:  2016-08-01       Impact factor: 43.841

2.  Thickness scaling of atomic-layer-deposited HfO2 films and their application to wafer-scale graphene tunnelling transistors.

Authors:  Seong-Jun Jeong; Yeahyun Gu; Jinseong Heo; Jaehyun Yang; Chang-Seok Lee; Min-Hyun Lee; Yunseong Lee; Hyoungsub Kim; Seongjun Park; Sungwoo Hwang
Journal:  Sci Rep       Date:  2016-02-10       Impact factor: 4.379

3.  Microsecond Pulse I-V Approach to Understanding Defects in High Mobility Bi-layer Oxide Semiconductor Transistor.

Authors:  Hyunsuk Woo; Sanghun Jeon
Journal:  Sci Rep       Date:  2017-08-15       Impact factor: 4.379

  3 in total

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