| Literature DB >> 24117323 |
Zhangxian Chen1, Wanchao Li, Ran Li, Yunfeng Zhang, Guoqin Xu, Hansong Cheng.
Abstract
Deposition technology of transparent conducting oxide (TCO) thin films is critical for high performance of optoelectronic devices. Solution-based fabrication methods can result in substantial cost reduction and enable broad applicability of the TCO thin films. Here we report a simple and highly effective solution process to fabricate indium-tin oxide (ITO) thin films with high uniformity, reproducibility, and scalability. The ITO films are highly transparent (90.2%) and conductive (ρ = 7.2 × 10(-4) Ω·cm) with the highest figure of merit (1.19 × 10(-2) Ω(-1)) among all the solution-processed ITO films reported to date. The high transparency and figure of merit, low sheet resistance (30 Ω/sq), and roughness (1.14 nm) are comparable with the benchmark properties of dc sputtering and can meet the requirements for most practical applications.Entities:
Year: 2013 PMID: 24117323 DOI: 10.1021/la4033282
Source DB: PubMed Journal: Langmuir ISSN: 0743-7463 Impact factor: 3.882