Literature DB >> 24114271

Mapping strain rate dependence of dislocation-defect interactions by atomistic simulations.

Yue Fan1, Yuri N Osetskiy, Sidney Yip, Bilge Yildiz.   

Abstract

Probing the mechanisms of defect-defect interactions at strain rates lower than 10(6) s(-1) is an unresolved challenge to date to molecular dynamics (MD) techniques. Here we propose an original atomistic approach based on transition state theory and the concept of a strain-dependent effective activation barrier that is capable of simulating the kinetics of dislocation-defect interactions at virtually any strain rate, exemplified within 10(-7) to 10(7) s(-1). We apply this approach to the problem of an edge dislocation colliding with a cluster of self-interstitial atoms (SIAs) under shear deformation. Using an activation-relaxation algorithm [Kushima A, et al. (2009) J Chem Phys 130:224504], we uncover a unique strain-rate-dependent trigger mechanism that allows the SIA cluster to be absorbed during the process, leading to dislocation climb. Guided by this finding, we determine the activation barrier of the trigger mechanism as a function of shear strain, and use that in a coarse-graining rate equation formulation for constructing a mechanism map in the phase space of strain rate and temperature. Our predictions of a crossover from a defect recovery at the low strain-rate regime to defect absorption behavior in the high strain-rate regime are validated against our own independent, direct MD simulations at 10(5) to 10(7) s(-1). Implications of the present approach for probing molecular-level mechanisms in strain-rate regimes previously considered inaccessible to atomistic simulations are discussed.

Entities:  

Keywords:  low strain rate atomistic simulation; mechanical properties; structural materials

Mesh:

Substances:

Year:  2013        PMID: 24114271      PMCID: PMC3816434          DOI: 10.1073/pnas.1310036110

Source DB:  PubMed          Journal:  Proc Natl Acad Sci U S A        ISSN: 0027-8424            Impact factor:   11.205


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