| Literature DB >> 24104614 |
Peter Bechtold, Ralph Hohenstein, Michael Schmidt.
Abstract
We introduce a method to objectively evaluate systems of differing beam deflection technologies that commonly are described by disparate technical specifications. Using our new approach based on resolvable spots we will compare commercially available random-access beam deflection technologies, namely galvanometer scanners, piezo scanners, MEMS scanners, acousto-optic deflectors, and electro-optic deflectors.Mesh：
Year: 2013 PMID： 24104614 DOI： 10.1364/OL.38.002934
Source DB: PubMed Journal: Opt Lett ISSN： 0146-9592 Impact factor: 3.776