Literature DB >> 24046703

2-(1,3-Di-thiol-2-yl-idene)-1,3-di-thiole-4-carbaldehyde.

Matthias Zeller1, Vladimir A Azov.   

Abstract

The structure of the title compound, C7H4OS4, at 100 K has ortho-rhom-bic symmetry. In the crystal, tetra-thia-fulvalene mol-ecules form π-stacks along the a axis, with a stacking distance of 3.4736 (6) Å. Along the b axis, parallel stacks are inter-connected with each other through a network of weak C-H⋯O hydrogen bonds and short S⋯S contacts [3.4813 (7) Å]. Additional short S⋯S contacts [3.4980 (9) Å] join parallel stacks along the c axis.

Entities:  

Year:  2013        PMID: 24046703      PMCID: PMC3770418          DOI: 10.1107/S160053681301711X

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For tetra­thia­fulvalene derivatives and their applications, see: Yamada & Sugimoto (2004 ▶); Segura & Martín (2001 ▶). For a review on synthetic chemistry of tetra­thia­fulvalenes, see: Fabre (2004 ▶). For a previous synthesis of the title compound, see: Garín et al. (1994 ▶). For reviews on ‘weak’ non-classical hydrogen bonding, see: Steiner (2002 ▶); Desiraju (2005 ▶). For reviews on halogenhalogen contacts, see: Metrangolo et al. (2008 ▶).

Experimental

Crystal data

C7H4OS4 M = 232.34 Orthorhombic, a = 3.8466 (3) Å b = 7.4052 (7) Å c = 30.577 (3) Å V = 870.99 (13) Å3 Z = 4 Mo Kα radiation μ = 1.03 mm−1 T = 100 K 0.50 × 0.21 × 0.13 mm

Data collection

Bruker SMART APEX CCD diffractometer Absorption correction: multi-scan (SADABS in APEX2; Bruker, 2012 ▶) T min = 0.675, T max = 0.746 6998 measured reflections 2734 independent reflections 2663 reflections with I > 2σ(I) R int = 0.015

Refinement

R[F 2 > 2σ(F 2)] = 0.024 wR(F 2) = 0.057 S = 1.13 2734 reflections 109 parameters H-atom parameters constrained Δρmax = 0.45 e Å−3 Δρmin = −0.25 e Å−3 Absolute structure: Flack x determined using 985 quotients [(I+)-(I-)]/[(I+)+(I-)] (Parsons & Flack, 2004 ▶), 1024 Friedel pairs Flack parameter: 0.01 (4) Data collection: APEX2 (Bruker, 2012 ▶); cell refinement: SAINT (Bruker, 2012 ▶); data reduction: SAINT; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL2013 (Sheldrick, 2013 ▶) and SHELXLE (Hübschle et al., 2011 ▶); molecular graphics: ORTEP-3 for Windows (Farrugia, 2012 ▶) and Mercury (Macrae et al., 2006 ▶); software used to prepare material for publication: publCIF (Westrip, 2010 ▶) and enCIFer (Allen et al., 2004 ▶). Crystal structure: contains datablock(s) I, global. DOI: 10.1107/S160053681301711X/pk2488sup1.cif Structure factors: contains datablock(s) I. DOI: 10.1107/S160053681301711X/pk2488Isup2.hkl Click here for additional data file. Supplementary material file. DOI: 10.1107/S160053681301711X/pk2488Isup3.cml Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C7H4OS4Dx = 1.772 Mg m3
Mr = 232.34Melting point: 383 K
Orthorhombic, P212121Mo Kα radiation, λ = 0.71073 Å
a = 3.8466 (3) ÅCell parameters from 4789 reflections
b = 7.4052 (7) Åθ = 2.8–31.4°
c = 30.577 (3) ŵ = 1.03 mm1
V = 870.99 (13) Å3T = 100 K
Z = 4Plate, red
F(000) = 4720.50 × 0.21 × 0.13 mm
Bruker SMART APEX CCD diffractometer2663 reflections with I > 2σ(I)
Radiation source: fine focus sealed tubeRint = 0.015
ω and φ scansθmax = 31.9°, θmin = 1.3°
Absorption correction: multi-scan (SADABS in APEX2; Bruker, 2012)h = −5→5
Tmin = 0.675, Tmax = 0.746k = −10→10
6998 measured reflectionsl = −42→44
2734 independent reflections
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.024H-atom parameters constrained
wR(F2) = 0.057w = 1/[σ2(Fo2) + (0.0237P)2 + 0.4121P] where P = (Fo2 + 2Fc2)/3
S = 1.13(Δ/σ)max < 0.001
2734 reflectionsΔρmax = 0.45 e Å3
109 parametersΔρmin = −0.25 e Å3
0 restraintsAbsolute structure: Flack x determined using 985 quotients [(I+)-(I-)]/[(I+)+(I-)] (Parsons & Flack, 2004), 1024 Friedel pairs.
Primary atom site location: structure-invariant direct methodsFlack parameter: 0.01 (4)
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.
xyzUiso*/Ueq
C10.1960 (6)0.3626 (3)0.24133 (7)0.0229 (4)
H10.09870.47450.25040.027*
C20.3148 (6)0.3446 (3)0.19636 (7)0.0178 (4)
C30.3234 (6)0.4823 (3)0.16743 (7)0.0188 (4)
H30.24170.59920.17510.023*
C40.5823 (5)0.2086 (3)0.12667 (7)0.0154 (4)
C50.7332 (5)0.1004 (3)0.09665 (7)0.0154 (4)
C60.9971 (6)−0.1700 (3)0.05523 (7)0.0213 (4)
H61.0784−0.28660.04730.026*
C71.0078 (7)−0.0331 (3)0.02682 (7)0.0213 (4)
H71.0959−0.0492−0.00190.026*
O10.2158 (5)0.2405 (2)0.26790 (5)0.0275 (4)
S10.47171 (14)0.13395 (6)0.17941 (2)0.01732 (10)
S20.48840 (15)0.43791 (6)0.11609 (2)0.01750 (10)
S30.85438 (14)0.17653 (7)0.04434 (2)0.01774 (11)
S40.82962 (14)−0.12822 (7)0.10718 (2)0.01786 (11)
U11U22U33U12U13U23
C10.0258 (11)0.0227 (9)0.0202 (10)0.0009 (9)−0.0027 (8)−0.0048 (8)
C20.0168 (9)0.0174 (9)0.0190 (9)0.0009 (8)−0.0026 (7)−0.0033 (7)
C30.0204 (10)0.0154 (8)0.0206 (10)0.0022 (8)−0.0014 (9)−0.0033 (7)
C40.0151 (9)0.0134 (8)0.0177 (9)−0.0006 (6)−0.0023 (7)0.0024 (6)
C50.0150 (9)0.0132 (8)0.0180 (9)−0.0011 (6)−0.0020 (7)0.0027 (7)
C60.0193 (9)0.0186 (9)0.0260 (10)0.0023 (9)−0.0008 (9)−0.0069 (7)
C70.0201 (10)0.0217 (9)0.0221 (10)0.0006 (9)0.0005 (9)−0.0056 (7)
O10.0359 (10)0.0274 (8)0.0192 (7)−0.0016 (8)−0.0012 (7)−0.0002 (6)
S10.0208 (2)0.01368 (19)0.0175 (2)0.00034 (19)0.00125 (19)0.00193 (17)
S20.0205 (2)0.01230 (18)0.0197 (2)0.00120 (19)−0.0006 (2)0.00242 (16)
S30.0183 (2)0.0181 (2)0.0169 (2)0.00035 (19)0.00033 (19)0.00149 (17)
S40.0192 (2)0.01267 (19)0.0217 (2)0.00182 (19)−0.00120 (19)0.00094 (17)
C1—O11.218 (3)C4—S21.7661 (19)
C1—C21.455 (3)C5—S31.759 (2)
C1—H10.9500C5—S41.763 (2)
C2—C31.350 (3)C6—C71.336 (3)
C2—S11.751 (2)C6—S41.742 (2)
C3—S21.725 (2)C6—H60.9500
C3—H30.9500C7—S31.745 (2)
C4—C51.349 (3)C7—H70.9500
C4—S11.757 (2)
O1—C1—C2122.9 (2)C4—C5—S4122.44 (15)
O1—C1—H1118.6S3—C5—S4114.71 (12)
C2—C1—H1118.6C7—C6—S4118.03 (16)
C3—C2—C1123.9 (2)C7—C6—H6121.0
C3—C2—S1118.05 (16)S4—C6—H6121.0
C1—C2—S1118.02 (16)C6—C7—S3117.70 (17)
C2—C3—S2117.48 (16)C6—C7—H7121.1
C2—C3—H3121.3S3—C7—H7121.1
S2—C3—H3121.3C2—S1—C494.30 (10)
C5—C4—S1122.80 (15)C3—S2—C495.26 (10)
C5—C4—S2122.29 (15)C7—S3—C594.82 (10)
S1—C4—S2114.90 (11)C6—S4—C594.69 (10)
C4—C5—S3122.85 (15)
O1—C1—C2—C3−174.0 (2)C5—C4—S1—C2178.23 (18)
O1—C1—C2—S13.4 (3)S2—C4—S1—C2−0.66 (13)
C1—C2—C3—S2177.51 (17)C2—C3—S2—C4−0.5 (2)
S1—C2—C3—S20.1 (3)C5—C4—S2—C3−178.19 (18)
S1—C4—C5—S3−178.29 (12)S1—C4—S2—C30.71 (13)
S2—C4—C5—S30.5 (3)C6—C7—S3—C5−1.6 (2)
S1—C4—C5—S40.8 (3)C4—C5—S3—C7−178.51 (18)
S2—C4—C5—S4179.63 (12)S4—C5—S3—C72.32 (14)
S4—C6—C7—S30.3 (3)C7—C6—S4—C51.2 (2)
C3—C2—S1—C40.3 (2)C4—C5—S4—C6178.61 (18)
C1—C2—S1—C4−177.22 (18)S3—C5—S4—C6−2.21 (14)
D—H···AD—HH···AD···AD—H···A
C1—H1···O1i0.952.383.228 (3)149
C3—H3···O1i0.952.693.445 (3)137
System S···SS···SSymmetry code
S3···S3ii3.4980 (9)(ii) -1/2+x, 1/2-y, -z
S3···S3iii3.4980 (9)(iii) 1/2+x, 1/2-y, -z
S2···S4iv3.4813 (7)(iv) x, 1+y, z
Table 1

Hydrogen-bond geometry (Å, °)

D—H⋯A D—HH⋯A DA D—H⋯A
C1—H1⋯O1i 0.952.383.228 (3)149
C3—H3⋯O1i 0.952.693.445 (3)137

Symmetry code: (i) .

  6 in total

1.  Synthesis strategies and chemistry of nonsymmetrically substituted tetrachalcogenafulvalenes.

Authors:  J M Fabre
Journal:  Chem Rev       Date:  2004-11       Impact factor: 60.622

2.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

Review 3.  C-H...O and other weak hydrogen bonds. From crystal engineering to virtual screening.

Authors:  Gautam R Desiraju
Journal:  Chem Commun (Camb)       Date:  2005-05-27       Impact factor: 6.222

4.  New Concepts in Tetrathiafulvalene Chemistry.

Authors:  José L. Segura; Nazario Martín
Journal:  Angew Chem Int Ed Engl       Date:  2001-04-17       Impact factor: 15.336

5.  Halogen bonding in supramolecular chemistry.

Authors:  Pierangelo Metrangolo; Franck Meyer; Tullio Pilati; Giuseppe Resnati; Giancarlo Terraneo
Journal:  Angew Chem Int Ed Engl       Date:  2008       Impact factor: 15.336

6.  ShelXle: a Qt graphical user interface for SHELXL.

Authors:  Christian B Hübschle; George M Sheldrick; Birger Dittrich
Journal:  J Appl Crystallogr       Date:  2011-11-12       Impact factor: 3.304

  6 in total

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