| Literature DB >> 24031837 |
Denise Osiro1, Rubens Bernardes Filho, Odilio Benedito Garrido Assis, Lúcio André de Castro Jorge, Luiz Alberto Colnago.
Abstract
Atomic Force Microscopy (AFM) can be used to obtain high-resolution topographical images of bacteria revealing surface details and cell integrity. During scanning however, the interactions between the AFM probe and the membrane results in distortion of the images. Such distortions or artifacts are the result of geometrical effects related to bacterial cell height, specimen curvature and the AFM probe geometry. The most common artifact in imaging is surface broadening, what can lead to errors in bacterial sizing. Several methods of correction have been proposed to compensate for these artifacts and in this study we describe a simple geometric model for the interaction between the tip (a pyramidal shaped AFM probe) and the bacterium (Escherichia coli JM-109 strain) to minimize the enlarging effect. Approaches to bacteria immobilization and examples of AFM images analysis are also described.Entities:
Keywords: Atomic force microscopy (AFM); Escherichia coli; bacteria visualization; cell dimensions
Year: 2012 PMID: 24031837 PMCID: PMC3768968 DOI: 10.1590/S1517-838220120001000040
Source DB: PubMed Journal: Braz J Microbiol ISSN: 1517-8382 Impact factor: 2.476
Figure 1Example of AFM image of Escherichia coli on cleaved silanized mica. Topographic image processed using side illumination (Topospm software).
Figure 2Closed observation of individual bacterias and corresponding 3D reconstructions.
Figure 3High-resolution AFM image and cross section measurement along the line shown in panel. Individual bacteria can be chosen and profile measured. In (a) a wide and in (b) a length measurement.
Figure 4Example of image processing: (A) initial feature identification, (B) marked automatically counted cells, and (C) the binarized image (the total number of bacterial cells is 26)
Automatic measurements from cells of binarized example of Figure 4 (C).
| Bacterium | Length (μm) | Wide (μm) |
|---|---|---|
| 1 | 1.86 | 1.58 |
| 2 | 2.15 | 1.58 |
| 3 | 2.44 | 1.15 |
| 4 | 2.44 | 1.58 |
| 5 | 2.58 | 1.29 |
| 6 | 2.58 | 1.72 |
| 7 | 2.72 | 1.72 |
| 8 | 3.01 | 1.86 |
| 9 | 3.15 | 1.43 |
| 10 | 3.15 | 1.43 |
| 11 | 3.15 | 1.58 |
| 12 | 3.58 | 1.43 |
| 13 | 3.58 | 1.43 |
| 14 | 3.58 | 1.86 |
| 15 | 3.58 | 2.15 |
| 16 | 3.72 | 1.43 |
| 17 | 3.72 | 1.43 |
| 18 | 3.72 | 1.72 |
| 19 | 3.72 | 1.72 |
| 20 | 3.72 | 2.01 |
| 21 | 4.01 | 1.86 |
| 22 | 4.15 | 1.58 |
| 23 | 4.30 | 1.58 |
| 24 | 4.44 | 1.86 |
| 25 | 5.44 | 1.43 |
| 26 | 5.44 | 2.01 |
Figure 5Motion of an AFM probe as it goes over a coliphorm bacterium attached to a flat surface. In such a measurement the side of the probe will cause a broadening in the image.